Nanopinion: A reliable and non-destructive experimental technique can monitor the crystal defect structure in nanomaterials
In his guest column, Professor Jenő Gubicza explains how to monitor the crystal defect structure in nanomaterials using a non-destructive experimental technique.
“X-ray line profile analysis (XLPA) is a very effective indirect method for the characterisation of the nanocrystalline microstructure. XLPA analyses the diffraction peak shape and yields the crystallite size distribution and the type and density of crystal defects with good statistics and in a non-destructive way.”
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